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Small and wide angle X-ray scattering
SAXS technology is used for the nanometric particles structure determination (size, form, distribution,…). Considering Copper radiation, we can generally say, for diffraction angle lower than 5° in 2θ. Samples can be solid or liquid. This is a non destructive method, accurate and just needs a minimum of sample preparation. You can use it both in research and in quality control. Its applications are various: colloids, metals, cement, clay, oil, polymer, plastics, proteins, pharmacy…  Combined SAXS-WAXS with 2 Imaging plate detection
systems and KB optic (2 crossed mirrors) To answer customer's requirements to perform measurements on textured samples or measurements of small angle scattering, Inel has designed a versatile SAXS / WAXS instrument. The device is scalable : the distance between the sample and the detector is variable, and the space around the sample is enough important for the development of cell or specific holder dedicated to the measurement (temperature chamber, cell traction, rotation table, etc.). Not to mention a good definition of the X-ray source and an associated optic system.  SAXS instrument with a linear detector and a parabolic mirror with slits Some specifications :
  Combination SAXS-WAXS on 2 different lines sharing the same source • 2D SAXS system using Imaging plates • WAXS using a CPS 180 curved real-time detector Some examples
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Inel France
Z.A. - C.D. 405
45410 Artenay, France
Tél. +33 (0)2 38 80 45 45 | Fax +33 (0)2 38 80 08 14
Z.A. - C.D. 405
45410 Artenay, France
Tél. +33 (0)2 38 80 45 45 | Fax +33 (0)2 38 80 08 14