| EQUINOX 5000 |
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 High resolution X-Ray
Diffractometer • Real time acquisition • 2-circle goniometers • Thin film attachment
The Equinox 5000 is a multi purpose X-ray diffractometer designed specifically for high level research applications including powder analysis, thin layer analysis, reflectometry, micro diffraction, .... The system utilizes a unique tall vertical goniometer in θ/θ or θ/2θ mode and the user has a large choice of features including higher resolution detectors and a large choice of X-ray sources. The free space in the sample compartment is very large and will accommodate practically any sample and any sample handling device including furnaces, auto samplers, large assemblies, ...  EQUINOX 5000 is designed to out perform conventional X-ray diffraction instruments for speed, resolution and safety. It could be used for conventional studies or can be completely customized or adapted for applications requiring 4 circle goniometer.
• Perfect for advanced research applications • Very reliable, Extremely accurate • Superb resolution 
Numerous software applications (*) : qualitative analysis, phase identification and quantification, degree of crystallinity determination, crystal structure analysis, phase transition on various environment, thin film, uni-axiale stress… (*) Applications dependi upon on choice of accesssories - ask us to help you configure a system asper your needs. Dowload EQUINOX 5000 documentation  EQUINOX 100 : Stand Alone Benchtop X-Ray diffractometer EQUINOX 1000 : Benchtop X-Ray diffractometer EQUINOX 2000 : XRD and thermo-diffraction EQUINOX 3000 : Powder X-Ray diffractometer EQUINOX 4000 : X-Ray diffractometer for micro diffraction EQUINOX 5000 : High resolution X-Ray diffractometer EQUINOX 6000 : X-Ray diffractometer for texture / stress       |
Inel France
Z.A. - C.D. 405
45410 Artenay, France
Tél. +33 (0)2 38 80 45 45 | Fax +33 (0)2 38 80 08 14
Z.A. - C.D. 405
45410 Artenay, France
Tél. +33 (0)2 38 80 45 45 | Fax +33 (0)2 38 80 08 14