 Stand Alone Benchtop X-Ray
Diffractometer
• Real time acquisition
• Standard powder applications
• No moving parts
Equinox 100. A rugged all purpose bench top style instrument designed for QA applications and routine X-ray diffraction studies. The perfect instrument when space is at a premium. Although the Equinox 100 has been designed for bench top use, its performance is truly excellent and will routinely out perform instruments measuring three times the size and costing twice as much.
Mesures are very fast compared with other diffractometers in that the unique Equinox curved detector can measure all diffraction peaks simultaneously and will usually complete an analysis in just a few seconds on many samples, no matter what the resolution requirements are. So there is no waiting around for a measurement to be completed, it takes just a few seconds.
• Simple to use
• Very reliable
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• Superb resolution
• Extremely accurate |
• No alignment
• No routine maintenance
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Uses standard electrical power - No water cooling required
Using Equinox is extremely simple. Operating conditions are saved in the software for easy operation. In a few seconds everyone can do XRD experiments.
Specifications
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Acquisition in real time over 110° 2θ
Generator 50 Watts
Wavelength : Copper or Cobalt |
Sample holder
Monochromatic optic
Software
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Numerous software applications (*): qualitative analysis, phase identification and quantification, crystalite size determination, crystal structure analysis, Rietveld analysis…
(*) Applications depend upon on choice of accesssories - ask us to help you configure a system as per your needs.
The best resolution for one of the lowest diffractometer costs of the market.
Download EQUINOX 100 documentation
EQUINOX 100 : Stand Alone Benchtop X-Ray diffractometer
EQUINOX 1000 : Benchtop X-Ray diffractometer
EQUINOX 2000 : XRD and thermo-diffraction
EQUINOX 3000 : Powder X-Ray diffractometer
EQUINOX 4000 : X-Ray diffractometer for micro diffraction
EQUINOX 5000 : High resolution X-Ray diffractometer
EQUINOX 6000 : X-Ray diffractometer for texture / stress
     
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