New product

Equinox X-ray Diffraction Systems employ a unique patented curved detector that replaces the conventional scanning goniometers used on other commercial instruments.

This unique detector is able to measure all diffraction peaks simultaneously. It eliminates the need for mechanical scanning devices and does no require complex scanning goniometers used in most other X-ray diffraction instruments.

• EQUINOX 1000 : benchtop X-ray diffractometer
  
• EQUINOX 2000 : Routine X-ray diffractometer
  
• EQUINOX 3000 : Research X-ray diffractometer
  
• EQUINOX 4000 : X-ray diffractometer for microdiffraction, mapping
  
• EQUINOX 5000 : High resolution X-ray diffractometer
  
• EQUINOX 6000 : diffractometer for texture / stress measurements